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Beilstein J. Nanotechnol. 2019, 10, 1103–1111, doi:10.3762/bjnano.10.110
Figure 1: Representative SEM images of samples grown at (a) 490 °C, (b) 530 °C, and (c) 580 °C, showing a lar...
Figure 2: (a) High-resolution HAADF image of a nanodot on top of the amorphous SiO2 layer, taken along the [1...
Figure 3: Chemical analysis of the sample grown at 530 °C. (a) Low-resolution cross-section STEM HAADF image ...
Figure 4: (a) PL spectra measured at 7 K and with an excitation power of 104 mW of a Si substrate and the bar...
Figure 5: Simulated transition energy as a function of the size of CIS nanodots according to Equation 1. The illustrate...